Backscattered Scanning Electron Microscopy and Image Analysis Of Sediments and Sedimentary Rocks
by David H Krinsley; Kenneth Pye; Jr, Sam Boggs; N Keith Tovey
Available Copies
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
by Krinsley, David H., Pye, Kenneth, Boggs Jr, Sam, Tovey, N. Keith
- Condition
- Used - Good
- ISBN
- 9780521453462
- Quantity Available
- 1
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Waltham Abbey, Essex, GBR
- Item Price
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NZ$8.06
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Cambridge University Press. Used - Good. Ships from UK in 48 hours or less (usually same day). Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. 100% money back guarantee. We are a world class secondhand bookstore based in Hertfordshire, United Kingdom and specialize in… Read more about this item Item Price
NZ$8.06