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Aberration-Corrected Analytical Transmission Electron Microscopy Hardback - 2011 - 1st Edition
by Rik Brydson
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- Hardcover
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Details
- Title Aberration-Corrected Analytical Transmission Electron Microscopy
- Author Rik Brydson
- Binding Hardback
- Edition number 1st
- Edition 1
- Condition New
- Pages 304
- Volumes 1
- Language ENG
- Publisher Wiley
- Date 2011-09-26
- Features Bibliography, Index, Table of Contents
- Bookseller's Inventory # A9780470518519
- ISBN 9780470518519 / 0470518510
- Weight 1.25 lbs (0.57 kg)
- Dimensions 9.1 x 6.2 x 0.8 in (23.11 x 15.75 x 2.03 cm)
- Library of Congress subjects Aberration, Transmission electron microscopy
- Library of Congress Catalog Number 2011019731
- Dewey Decimal Code 502.825
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From the rear cover
Electron microscopy has undergone significant developments in recent years due to the practical implementation of schemes which can diagnose and correct for the imperfections (aberrations) in both the probe-forming and the image-forming electron lenses. This book presents the background and implementation of techniques which have allowed true imaging and chemical analysis at the scale of single atoms as applied to the fields of materials science and nanotechnology.
Edited and written by the founders of the world's first aberration corrected Scanning Transmission Electron Microscope facility (SuperSTEM at Daresbury Laboratories in the UK), this text:
- Presents the theory, instrumentation and applications of aberration correction in transmission electron microscopes
- Is based on an established course taught at postgraduate summer schools by leaders in this field.
- Is essential reading for researchers involved in the analysis of materials at the nanoscale
Ideal for final-year undergraduates and postgraduate students, as well as academics and industrialists involved in electron microscopy, this book can be used as a component of courses in nanotechnology, materials science, physics, chemistry or engineering disciplines.