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Design-For-Test for Digital Ic's & Embedded Core Systems
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Design-For-Test for Digital Ic's & Embedded Core Systems Paperback - 1999

by Crouch, Alfred L

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  • Paperback

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Prentice Hall. Paperback. New. New. In shrink wrap. Looks like an interesting title!
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Details

  • Title Design-For-Test for Digital Ic's & Embedded Core Systems
  • Author Crouch, Alfred L
  • Binding Paperback
  • Edition 1st edition
  • Condition New
  • Pages 347
  • Volumes 1
  • Language ENG
  • Publisher Prentice Hall, Upper Saddle River, N.J.
  • Date June 15, 1999
  • Illustrated Yes
  • Bookseller's Inventory # Q-0130848271
  • ISBN 9780130848277 / 0130848271
  • Weight 1.33 lbs (0.60 kg)
  • Dimensions 9.18 x 6.98 x 0.85 in (23.32 x 17.73 x 2.16 cm)
  • Library of Congress subjects Electronic circuit design, Digital integrated circuits - Design and
  • Library of Congress Catalog Number 99-23871
  • Dewey Decimal Code 621

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About the author

AL CROUCH began his testing career repairing meteorological equipment for the U.S. Air Force. He later earned BSEE and MSEE degrees from the University of Kentucky. He has worked for Texas Instruments, Digital Equipment Corporation, and Motorola, focusing on design-for-test, test automation, and computer aided testing. He has been issued nine U.S. Patents and is an experienced trainer and conference presenter.