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Design-For-Test For Digital IC's and Embedded Core Systems
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Design-For-Test For Digital IC's and Embedded Core Systems Hardcover - 1999

by Crouch, Alfred

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  • Hardcover
  • first

Description

Upper Saddle River, N.J.: Prentice Hall, 1999. Comprehensive text introduces the basic concepts of test and design-for-test (DFT), and addresses the application of these concepts with an eye toward the trade-offs of the engineering budgets (area, frequency, power, etc.), the business drivers, and the cost drivers. This practical guide on the test and Design-for-test topics has been developed along the lines of a just what you need to know and how to do it guide that explains the topic, the trade-offs, and relates the topic to the design flow. Key topics include: Core-based design, focusing on embedded cores and embedded memories. System-on-a-chip and ultra-large scale integrated design issues. AC scan, at-speed scan, and embedded DFT. Built-in self-test, including memory BIST, logic BIST, and scan BIST. Virtual test sockets and testing in isolation. Design for reuse, including reuse vectors and cores. Test issues being addressed by VSIA and the IEEE P1500 Standard. Design-for-Test for Digital IC's and Embedded Core Systems is filled with full-page graphics taken directly from the author's teaching materials. Every section is illustrated with flow-charts, engineering diagrams, and conceptual summaries to make learning and reference fast and easy. This book is a must for the engineers and managers involved in design and testing. The enclosed Brand-New & Sealed CD-ROM contains full-color versions of all the book's illustrations in Acrobat PDF format. These images may be viewed interactively on screen or printed out to create overheads for teaching. Acrobat Reader software for Windows and UNIX computers is included. 349 pp. Illustrated.. First Edition. Hard Cover. New. 8vo - over 7¾" - 9¾" tall.
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Details

  • Title Design-For-Test For Digital IC's and Embedded Core Systems
  • Author Crouch, Alfred
  • Binding Hardcover
  • Edition First Edition
  • Condition New
  • Pages 347
  • Volumes 1
  • Language ENG
  • Publisher Prentice Hall, Upper Saddle River, N.J.
  • Date 1999
  • Illustrated Yes
  • Bookseller's Inventory # EG-653
  • ISBN 9780130848277 / 0130848271
  • Weight 1.33 lbs (0.60 kg)
  • Dimensions 9.18 x 6.98 x 0.85 in (23.32 x 17.73 x 2.16 cm)
  • Library of Congress subjects Electronic circuit design, Digital integrated circuits - Design and
  • Library of Congress Catalog Number 99-23871
  • Dewey Decimal Code 621

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About the author

AL CROUCH began his testing career repairing meteorological equipment for the U.S. Air Force. He later earned BSEE and MSEE degrees from the University of Kentucky. He has worked for Texas Instruments, Digital Equipment Corporation, and Motorola, focusing on design-for-test, test automation, and computer aided testing. He has been issued nine U.S. Patents and is an experienced trainer and conference presenter.

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