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Reflection High-Energy Electron Diffraction Hardcover - 2004
by Ichimiya, Ayahiko
- Used
- Good
- Hardcover
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Details
- Title Reflection High-Energy Electron Diffraction
- Author Ichimiya, Ayahiko
- Binding Hardcover
- Condition Used - Good
- Pages 366
- Volumes 1
- Language ENG
- Publisher Cambridge University Press
- Date 2004-12-13
- Illustrated Yes
- Features Bibliography, Illustrated, Index, Table of Contents
- Bookseller's Inventory # 0521453739.G
- ISBN 9780521453738 / 0521453739
- Weight 1.95 lbs (0.88 kg)
- Dimensions 9.82 x 7.08 x 0.95 in (24.94 x 17.98 x 2.41 cm)
- Library of Congress subjects Reflection high energy electron diffraction, Thin films - Surfaces - Analysis
- Library of Congress Catalog Number 2004045180
- Dewey Decimal Code 530.427
First line
Reflection high-energy electron diffraction (RHEED or R-HEED) is a technique for surface structural analysis that is remarkably simple to implement, requiring at the minimum only an electron gun, a phosphor screen, and a clean surface.