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Reliability Wearout Mechanisms In Advanced Cmos Technologies (Hb 2009) Hardcover - 2009
by Strong
- Used
- very good
Description
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Details
- Title Reliability Wearout Mechanisms In Advanced Cmos Technologies (Hb 2009)
- Author Strong
- Binding Hardcover
- Edition U.S. Edition
- Condition Used - Very Good
- Pages 640
- Volumes 1
- Language ENG
- Publisher John Wiley & Sons, Piscataway, NJ
- Date 2009-09-01
- Features Bibliography, Index, Table of Contents
- Bookseller's Inventory # 9780471731726
- ISBN 9780471731726 / 0471731722
- Weight 2.16 lbs (0.98 kg)
- Dimensions 9.3 x 6.4 x 1.3 in (23.62 x 16.26 x 3.30 cm)
-
Themes
- Aspects (Academic): Science/Technology Aspects
- Library of Congress subjects Metal oxide semiconductors, Complementary -
- Library of Congress Catalog Number 2011377262
- Dewey Decimal Code 621.397
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From the jacket flap
IEEE Press Series on Microelectronic Systems
Stewart K. Tewksbury and Joe E. Brewer, Series Editors
Reliability Wearout Mechanisms in Advanced CMOS Technologies Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Su, Giuseppe LaRosa, Timothy D. Sullivan, and Stewart E. Rauch, III