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Scanning Electron Microscopy and X-Ray Microanalysis Hardback -
by Linda Sawyer David C. Joy J.R. Michael Linda C. Sawyer Eric Lifshin Patrick Echlin Charles E. Lyman D.C. Joy Dale E. Newbury Joseph Goldstein
- New
- Hardcover
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.
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- Title Scanning Electron Microscopy and X-Ray Microanalysis
- Author Linda Sawyer David C. Joy J.R. Michael Linda C. Sawyer Eric Lifshin Patrick Echlin Charles E. Lyman D.C. Joy Dale E. Newbury Joseph Goldstein
- Binding Hardback
- Edition 3rd
- Condition New
- Pages 689
- Volumes 1
- Language ENG
- Publisher Springer , USA
- Date pp. xix + 689 3rd Edition
- Illustrated Yes
- Features Bibliography, Illustrated, Index, Maps
- Bookseller's Inventory # 6293781
- ISBN 9780306472923 / 0306472929
- Weight 3.65 lbs (1.66 kg)
- Dimensions 9.9 x 7.3 x 1.4 in (25.15 x 18.54 x 3.56 cm)
- Library of Congress subjects Scanning electron microscopy, X-ray microanalysis
- Library of Congress Catalog Number 2002028276
- Dewey Decimal Code 502.825
About Cold Books New York, United States
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