Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces - Oxford Series in Optical and Imaging Sciences - Revised Edition
by Sarid, Dror
- Used
- Very Good
- Hardcover
- Condition
- Very Good/No Dust Jacket
- ISBN 10
- 019509204X
- ISBN 13
- 9780195092042
- Seller
-
Albuquerque, New Mexico, United States
Payment Methods Accepted
About This Item
New York: Oxford University Press, 1994. Revised Edition - Third Printing . Hard Back. Very Good/No Dust Jacket. 6 1/4" X 9 1/2. 263 Pages Indexed. Solid book in great condition. High interest and major advances in the technology of scanning force microscopy that have taken place since the 1991 release has made this Revised Edition necessary. The tenth anniversary of Scanning Tunneling Microscopy, celebrated at the Sixth International Conference on Scanning Tunneling Microscopy in Interlaken, Switzerland August 12-16, 1991, with more than one thousand participants, produced three volumes of papers that attest to the ever-growing interest in this technology. As the field of scanning force microscopy has matured, a gradual shift in gears has taken place, from activities involving the development of instruments to their use as probes in a large rainbow of disciplines. Therefore, this new print, which includes all the material contained in the first print, additionally has the latest available list of new references that deal with electric, magnetic, and atomic force microscopy. It should also be noted that several scanning force microscopy related reviews have appeared, some of which present detailed information on specialized topics. Contents in 13 Chapters: Mechanical Properties of Levers, Resonance Enhancement, Sources of Noise, Tuneling Detection System, Capacitance Detection System, Homodyne Detection System, Heterodyne Detection System, Laser-Diode Feedback Detection System, Polarization Detection System, Deflection System, Electric Force Microscopy, Magnetic Force Microscopy, and Atomic Force Microscopy.
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Details
- Bookseller
- Dons Book Store (US)
- Bookseller's Inventory #
- 16182
- Title
- Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces - Oxford Series in Optical and Imaging Sciences - Revised Edition
- Author
- Sarid, Dror
- Format/Binding
- Hard Back
- Book Condition
- Used - Very Good
- Jacket Condition
- No Dust Jacket
- Quantity Available
- 1
- Edition
- Revised Edition - Third Printing
- Binding
- Hardcover
- ISBN 10
- 019509204X
- ISBN 13
- 9780195092042
- Publisher
- Oxford University Press
- Place of Publication
- New York
- Date Published
- 1994
- Size
- 6 1/4" X 9 1/2
- Keywords
- SCANNING TUNNELING MICROSCOPY ATOMIC FORCE AFM CANTILEVER
- Note
- May be a multi-volume set and require additional postage.
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About the Seller
Dons Book Store
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Albuquerque, New Mexico
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- Jacket
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