Technology in Review Vol. II, Summer 1998: A Periodic Journal Published for the Technical Community of National Semiconductor in the Interest of Advancing Interdisciplinary Knowledge

National Semiconductor, 1988-01-01. Paperback. Very Good. National Semiconductor, 1988, Vol. II. Paper covers, 80 pp. In very good condition. Cream and brown paper covers with black and cream lettering on front and spine. Light bumping and creasing along edges of covers and light overall scuffing and soiling. Binding tight. Pages clean and unmarked. A selection of papers delivered by the technical staff of National Semiconductor at recent electronics conferences. Contents include: Sixteen-Bit High-Performance Core Designed For ASIC; A Microcontroller-Based Smart Control Cell; A 33 Mbit/sec Data Synchronizing Phase-Locked-Loop Circuit; The NS32532 — High Performance And Software Compatibility; A Comparison Of The Electrical Specifications Of Popular Bus Standards; Three-Dimensional Transient Simulation Of Electro-Thermal Behavior In Semiconductor Devices; Yield Diagnosis ThroughInterpretation Of Tester Data; Eliminating The Cleanroom: Experiences With An Open-Area SMIF Isolation Site (OASIS); Modeling The AC Impedance Of The Polysilicon-Silicon Interface; Modeling Of Delay And CrossTalk In Interconnects; A VLSI Poly Bipolar Process With 100-ps Gate Delay; An ECL Memory Cell With SeparateRead And Write Ports; A High-Performance Bipolar ECL Standard Cell Library For Optimal Design Of High-Speed Bipolar LSI; Poly-Emitter Bipolar Hot-Camer Effects In An Advanced BiCMOS Technology; A 12-ns 256K BiCMOS SRAM; A New Definition Of Package Thermal Measurement