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Technology in Review Vol. IV Winter 1989: A Periodic Journal Published for the Technical Community of National Semiconductor in the Interest of Advancing Interdisciplinary Knowledge

Technology in Review Vol. IV Winter 1989: A Periodic Journal Published for the Technical Community of National Semiconductor in the Interest of Advancing Interdisciplinary Knowledge

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Technology in Review Vol. IV Winter 1989: A Periodic Journal Published for the Technical Community of National Semiconductor in the Interest of Advancing Interdisciplinary Knowledge

by Jon Rant [Editor]

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  • Very Good
  • Paperback
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About This Item

National Semiconductor, 1989-01-01. Paperback. Very Good. National Semiconductor, [Published date: 1989], Vol. IV. Paper covers, 82 pp. In very good condition. Cream and Blue paper covers with black and cream lettering on front and spine. Light bumping to edges of covers and Light overall scuffing Binding tight. Pages clean and unmarked. NOT Ex-Library. No remainder marks. A selection of papers delivered by the technical staff of National Semiconductor at recent electronics conferences. Contents include: ASIC Design Verification Of Microcontroller Cores by J Hallman; Today's ETR Designs by M. Agbai-Yazdy; C In Embedded Systems And The Microcontroller World by D. LaVeme; Limits Of Backplane Bus Design by P.L. Borrill; Current Developments In Futurebus by D. Hawley; New Switching Regulator's Unique Compensation Scheme Assures Design Simplicity by J. Scolio; A Systems Approach To Smart Sensors And Smart Actuator Design by M. Alby; Development Of A Helium/Chlorine-Based Polysilicon Etch Process For Use At A 1-Micron BiCMOS Gate/Emitter Poly Etch by J. McOmber; Photolithography Expert Systems At National Semiconductor by P. Leitner and R. Brown; Thermocompression Joining Of Copper To Copper For TAB by V. Sajja; Package Cracking And Moisture Absorption In Plastic Surface-Mount Components by A. Switky;Electrical Properties Of Thermally Oxidized Silicon by B. Deal; Testability Using Random Access Test Registers by C. Bui; Design For Test And The Cost Of Quality by C. Salzmann, M. Funcell and R. Taylor.

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Details

Bookseller
Epilonian Books US (US)
Bookseller's Inventory #
20160608005
Title
Technology in Review Vol. IV Winter 1989: A Periodic Journal Published for the Technical Community of National Semiconductor in the Interest of Advancing Interdisciplinary Knowledge
Author
Jon Rant [Editor]
Format/Binding
Paperback
Book Condition
Used - Very Good
Quantity Available
1
Publisher
National Semiconductor
Date Published
1989-01-01
Keywords
Computers, technology

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About the Seller

Epilonian Books

Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Biblio member since 2009
Manhattan Beach, California

About Epilonian Books

Epilonian Books is a small bookseller dedicated to preserving ephemera and any esoteric or imminently extinct written work.

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