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X-Ray Fluorescence Spectrometry
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X-Ray Fluorescence Spectrometry Hardcover - 1999 - 2nd Edition

by Jenkins, Ron

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  • Hardcover

Description

Wiley-Interscience, 1999-06-18. Hardcover. New. New. In shrink wrap. Looks like an interesting title!
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Details

  • Title X-Ray Fluorescence Spectrometry
  • Author Jenkins, Ron
  • Binding Hardcover
  • Edition number 2nd
  • Edition 2
  • Condition New
  • Pages 232
  • Volumes 1
  • Language ENG
  • Publisher Wiley-Interscience
  • Date 1999-06-18
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index
  • Bookseller's Inventory # Q-0471299421
  • ISBN 9780471299424 / 0471299421
  • Weight 1 lbs (0.45 kg)
  • Dimensions 9.37 x 6.32 x 0.84 in (23.80 x 16.05 x 2.13 cm)
  • Library of Congress subjects X-ray spectroscopy, Fluorescence spectroscopy
  • Library of Congress Catalog Number 98-39008
  • Dewey Decimal Code 543.085

From the publisher

Mit Hilfe der Rntgenfluoreszenzspektroskopie (XRF) erhlt man "Fingerabdrcke" chemischer Substanzen. Die letzten Errungenschaften auf diesem Gebiet behandelt dieses Buch, in dessen Neuauflage auch Kapitel zur Geschichte der XRF, zum Aufbau von Rntgenspektrographen, zu Rntgenspektren und speziellen Anwendungen aufgenommen wurden. Durch den verstndlichen Stil ist der Band fr Neueinsteiger und erfahrene Fachleute gleicherma en geeignet. (08/99)

From the rear cover

X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade.

Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra.

Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of X-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis--from specimen preparation to real-world industrial application.

Favored by the American Chemical Society and the International Centre for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists--in chemical analysis, geology, metallurgy, and materials science.

An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes:
* The history of X-ray fluorescence spectrometry--new to this edition.
* A critical review of the most useful X-ray spectrometers.
* Techniques and procedures for quantitative and qualitative analysis.
* Modern applications and industrial trends.
* X-ray spectra--new to this edition.

About the author

RON JENKINS teaches at the Inter-national Centre for Diffraction Data.