Scanning Electron Microscopy and X-Ray Microanalysis

by Lee, Robert Edward

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Scanning Electron Microscopy and X-Ray Microanalysis

by Lee, Robert Edward

Condition
Used - Good
Binding
Hardcover
ISBN
9780138137595
Quantity Available
1
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Bonita
Newport Coast, California, USA
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Item Price
NZ$105.58

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Description:
hardcover. Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Item Price
NZ$105.58