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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques
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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques Hardcover - 2009

by Bharat Bhushan (Editor); Harald Fuchs (Editor)

Details

  • Title Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques
  • Author Bharat Bhushan (Editor); Harald Fuchs (Editor)
  • Binding Hardcover
  • Edition U. S. EDITION
  • Pages 236
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Date 2009
  • Illustrated Yes
  • Features Illustrated, Index, Table of Contents
  • ISBN 9783540850366 / 3540850368
  • Weight 1.15 lbs (0.52 kg)
  • Dimensions 9.4 x 6.3 x 0.6 in (23.88 x 16.00 x 1.52 cm)
  • Dewey Decimal Code 502.82

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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology)
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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology)

by Bhushan, Bharat [Editor]; Fuchs, Harald [Editor];

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APPLIED SCANNING PROBE METHODS XI
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APPLIED SCANNING PROBE METHODS XI

by BHARAT BHUSHAN,HARALD FUCHS,

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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience andTechnology)
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by Bharat Bhushan

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Applied Scanning Probe Methods Xi: Scanning Probe Microscopy Techniques
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by Bhushan B.

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