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NANOSCALE CHARACTERISATION OF FERROELECTRIC MATERIALS : SCANNING PROBE MICROSCOPY APPROACH (NANOSCIENCE AND TECHNOLOGY)
by M. ALEXE , A. GRUVERMAN ,
- New
- Hardcover
- first
- Condition
- New/New
- ISBN 10
- 3540206620
- ISBN 13
- 9783540206620
- Seller
-
New Delhi, India
Payment Methods Accepted
About This Item
Springer, 2004. 1St. Hardcover. New/New.
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Details
- Bookseller
- DELHI BOOK STORE (IN)
- Bookseller's Inventory #
- AME_9783540206620
- Title
- NANOSCALE CHARACTERISATION OF FERROELECTRIC MATERIALS : SCANNING PROBE MICROSCOPY APPROACH (NANOSCIENCE AND TECHNOLOGY)
- Author
- M. ALEXE , A. GRUVERMAN ,
- Format/Binding
- Hardcover
- Book Condition
- New New
- Jacket Condition
- New
- Quantity Available
- 1
- Edition
- 1St
- ISBN 10
- 3540206620
- ISBN 13
- 9783540206620
- Publisher
- Springer
- Place of Publication
- Secaucus, New Jersey, U.s.a.
- Date Published
- 2004
- Keywords
- PHYSICS NANOSCALE CHARACTERISATION OF FERROELECTRIC MATERIALS : SCANNING PROBE MICROSCOPY APPROACH (NANOSCIENCE AND TECHNOLOGY)
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About the Seller
DELHI BOOK STORE
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New Delhi
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