Skip to content

Semiconductor Material and Device Characterization
Stock Photo: Cover May Be Different

Semiconductor Material and Device Characterization Hardcover - 1990

by Schroder, Dieter K

  • Used
  • Good
  • Hardcover
Drop Ship Order

Description

hardcover. Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Used - Good
NZ$96.19
FREE Shipping to USA Standard delivery: 7 to 14 days
More Shipping Options
Ships from Bonita (California, United States)

Details

  • Title Semiconductor Material and Device Characterization
  • Author Schroder, Dieter K
  • Binding Hardcover
  • Edition First Edition; F
  • Condition Used - Good
  • Pages 624
  • Volumes 1
  • Language ENG
  • Publisher Wiley-Interscience, New York
  • Date 1990
  • Bookseller's Inventory # 0471511048.G
  • ISBN 9780471511045 / 0471511048
  • Weight 2.11 lbs (0.96 kg)
  • Dimensions 9.53 x 6.47 x 1.18 in (24.21 x 16.43 x 3.00 cm)
  • Library of Congress subjects Semiconductors, Semiconductors - Testing
  • Library of Congress Catalog Number 89024881
  • Dewey Decimal Code 621.381

About Bonita California, United States

Biblio member since 2020
Seller rating: This seller has earned a 5 of 5 Stars rating from Biblio customers.

Terms of Sale: 30 day return guarantee, with full refund including original shipping costs for up to 30 days after delivery if an item arrives misdescribed or damaged.

Browse books from Bonita