Description:
UsedGood. There is either a name, note, or insciprtion on the inside cover. The pages are sun faded and slightly yellowing. We flipped through this book and didn't notice any notes or underlines. The cover has visible markings and wear. Some corner dings. The dust jacket shows normal wear and tear. The dust jacket has minor damage or small tear. This is a hardcover copy. Fast Shipping - Each order powers our free bookstore in Chicago and sending books to Africa!
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Semiconductor Material and Device Characterization Hardcover - 1990
by Dieter K. Schroder
Details
- Title Semiconductor Material and Device Characterization
- Author Dieter K. Schroder
- Binding Hardcover
- Edition First Edition; F
- Pages 624
- Volumes 1
- Language ENG
- Publisher Wiley-Interscience, New York
- Date 1990
- ISBN 9780471511045 / 0471511048
- Weight 2.11 lbs (0.96 kg)
- Dimensions 9.53 x 6.47 x 1.18 in (24.21 x 16.43 x 3.00 cm)
- Library of Congress subjects Semiconductors, Semiconductors - Testing
- Library of Congress Catalog Number 89024881
- Dewey Decimal Code 621.381
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Semiconductor Material and Device Characterization
by Schroder, Dieter K.
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- Hardcover
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- UsedGood
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- Hardcover
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- 9780471511045 / 0471511048
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Semiconductor Material and Device Characterization
by Dieter K. Schroder
- Used
- Good
- Hardcover
- Condition
- Used - Good
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
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Seattle, Washington, United States
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Wiley & Sons, Incorporated, John, 1990. Hardcover. Good. Disclaimer:A copy that has been read, but remains in clean condition. All pages are intact, and the cover is intact. The spine may show signs of wear. Pages can include limited notes and highlighting, and the copy can include previous owner inscriptions. The dust jacket is missing. At ThriftBooks, our motto is: Read More, Spend Less.
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Semiconductor Material and Device Characterization
by Schroder, Dieter K
- Used
- Condition
- Used - Good
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Quantity Available
- 1
- Seller
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Mishawaka, Indiana, United States
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NZ$22.11FREE shipping to USA
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Wiley & Sons, Incorporated, John. Used - Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
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Semiconductor Material and Device Characterization
by Schroder, Dieter K.
- Used
- Near Fine
- Hardcover
- Condition
- Used - Near Fine
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
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Vancouver, Washington, United States
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NZ$78.26NZ$9.97 shipping to USA
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Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1990 hardback book and dust jacket in near fine condition. Hardcover. Near Fine/Near Fine.
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Semiconductor Material and Device Characterization
- Used
- Good
- Hardcover
- Condition
- Used - Good
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Quantity Available
- 1
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DFW, Texas, United States
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good. hardcover. cover and corner wear. no dust jacket. note on title page. bent cover corners. name on book edge.
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Semiconductor Material and Device Characterization
by Schroder, Dieter K.
- Used
- Good
- Hardcover
- Condition
- Used - Good
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Quantity Available
- 1
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Newport Coast, California, United States
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hardcover. Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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Semiconductor Material and Device Characterization - 1st Edition/1st Printing
by Schroder, Dieter K.
- Used
- Hardcover
- first
- Condition
- Used - Near Fine in Near Fine dust jacket
- Edition
- First Edition; First Printing
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Quantity Available
- 1
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Summerville, South Carolina, United States
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NZ$133.20NZ$11.66 shipping to USA
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New York: John Wiley & Sons, Inc.. Near Fine in Near Fine dust jacket. 1990. First Edition; First Printing. Hardcover. 0471511048 . A handsome first edition/first printing in Near Fine condition with previous owner's signature to front flyleaf in alike dust-jacket with light edgewear. [i-iv] v-vii [viii] ix-xv [xvi-xviii], 1-599 [600-6] pages; Book is written for graduate students and industrial researchers who want to learn more about the wide spectrum of measurement methods found in the modern semiconductor industry ; 8vo .
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Semiconductor Material and Device Characterization
by Schroder, Dieter K
- New
- Hardcover
- Condition
- New
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Quantity Available
- 1
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San Diego, California, United States
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NZ$143.94NZ$9.07 shipping to USA
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Wiley-Interscience, 1990-07-04. Hardcover. New. New. In shrink wrap. Looks like an interesting title!
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