High Resolution Focused Ion Beams

by Jon Orloff, Lynwood Swanson, Mark Utlaut

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High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology

by Orloff, Jon; Swanson, Lynwood; Utlaut, Mark

Condition
New
Published
2002-10-31
Binding
Hardcover
ISBN
9780306473500
Quantity Available
1
Seller
San Diego, California, USA
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
NZ$771.32

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Description:
Springer, 2002-10-31. Hardcover. New. New. In shrink wrap. Looks like an interesting title!
Item Price
NZ$771.32
No image available

High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology

by Orloff, Jon

Condition
New
ISBN
9780306473500
Quantity Available
1
Seller
Victoria, British Columbia, CAN
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
NZ$487.75

Show Details

Description:
Springer. New. Special order direct from the distributor
Item Price
NZ$487.75