Description:
Elsevier Science & Technology, 2006. Hardcover. Good. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.Dust jacket quality is not guaranteed.
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VLSI Test Principles and Architectures: Design for Testability Hardcover - 2006
by Laung-Terng Wang; Cheng-Wen Wu; Xiaoqing Wen
Details
- Title VLSI Test Principles and Architectures: Design for Testability
- Author Laung-Terng Wang; Cheng-Wen Wu; Xiaoqing Wen
- Binding Hardcover
- Edition INTERNATIONAL ED
- Pages 808
- Volumes 1
- Language ENG
- Publisher Morgan Kaufmann Publishers, U.S.A.
- Date July 7, 2006
- ISBN 9780123705976 / 0123705975
- Weight 3.92 lbs (1.78 kg)
- Dimensions 9.38 x 8.12 x 2.06 in (23.83 x 20.62 x 5.23 cm)
- Library of Congress subjects Integrated circuits - Very large scale, Integrated circuits - Very large scale
- Library of Congress Catalog Number 2006006869
- Dewey Decimal Code 621.395
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VLSI Test Principles and Architectures : Design for Testability
by Cheng-Wen Wu; Xiaoqing Wen; Laung-Terng Wang
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- Hardcover
- ISBN 10 / ISBN 13
- 9780123705976 / 0123705975
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VLSI Test Principles And Architectures: Design for Testability
by Wang, Laung-terng (Editor)/ Wu, Cheng-Wen (Editor)/ Wen, Xiaoqing (Editor)
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- Hardcover
- Condition
- New
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- Hardcover
- ISBN 10 / ISBN 13
- 9780123705976 / 0123705975
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Exeter, Devon, United Kingdom
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NZ$143.76NZ$21.30 shipping to USA
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Morgan Kaufmann Pub, 2006. Hardcover. New. 1st edition. 777 pages. 9.25x7.50x2.00 inches.
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VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing; Abdel-Hafez, Khader S. [Contributor]; Bhattacharya, Soumendu [Contributor]; Chatterjee, Abhijit [Contributor]; Chen, Xinghao [Contributor]; Cheng, Kwang-Ting (Tim) [Contributor]; Eklow, William [Contributor
- New
- Hardcover
- Condition
- New
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780123705976 / 0123705975
- Quantity Available
- 1
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San Diego, California, United States
- Item Price
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NZ$178.56NZ$9.28 shipping to USA
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Morgan Kaufmann. hardcover. New. New. In shrink wrap. Looks like an interesting title!
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NZ$178.56
NZ$9.28
shipping to USA
Stock Photo: Cover May Be Different
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing; Abdel-Hafez, Khader S. [Contributor]; Bhattacharya, Soumendu [Contributor]; Chatterjee, Abhijit [Contributor]; Chen, Xinghao [Contributor]; Cheng, Kwang-Ting (Tim) [Contributor]; Eklow, William [Contributor
- Used
- good
- Hardcover
- Condition
- Used - Good
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780123705976 / 0123705975
- Quantity Available
- 2
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Franklin Lakes, New Jersey, United States
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NZ$192.65NZ$6.64 shipping to USA
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Morgan Kaufmann, 2006-07-21. Hardcover. Good. Textbook, May Have Highlights, Notes and/or Underlining, BOOK ONLYNO ACCESS CODE, NO CD, Ships with Emailed Tracking
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NZ$192.65
NZ$6.64
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