Skip to content

Applied Scanning Probe Methods III: Characterization
Stock Photo: Cover May Be Different

Applied Scanning Probe Methods III: Characterization Hardcover - 2006

by Bharat Bhushan (Editor); Harald Fuchs (Editor)


Details

  • Title Applied Scanning Probe Methods III: Characterization
  • Author Bharat Bhushan (Editor); Harald Fuchs (Editor)
  • Binding Hardcover
  • Edition 1St
  • Pages 378
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Date 2006-02-22
  • Illustrated Yes
  • Features Illustrated, Index, Table of Contents
  • ISBN 9783540269090 / 3540269096
  • Weight 1.58 lbs (0.72 kg)
  • Dimensions 9.42 x 6.48 x 0.79 in (23.93 x 16.46 x 2.01 cm)
  • Dewey Decimal Code 502.82
Back to Top

More Copies for Sale

APPLIED SCANNING PROBE METHODS III: CHARACTERIZATION (NANOSCIENCE AND TECHNOLOGY)
Stock Photo: Cover May Be Different

APPLIED SCANNING PROBE METHODS III: CHARACTERIZATION (NANOSCIENCE AND TECHNOLOGY)

by BHARAT BHUSHAN,

  • New
  • Hardcover
  • first
Condition
New
Edition
1St
Binding
Hardcover
ISBN 10 / ISBN 13
9783540269090 / 3540269096
Quantity Available
5
Seller
New Delhi, India
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
NZ$105.64
NZ$16.51 shipping to USA

Show Details

Description:
Springer, 2006. 1St. Hardcover. New/New.
Item Price
NZ$105.64
NZ$16.51 shipping to USA
Applied Scanning Probe Methods III
Stock Photo: Cover May Be Different

Applied Scanning Probe Methods III

  • Used
  • Hardcover
Condition
Used
Binding
Hardcover
ISBN 10 / ISBN 13
9783540269090 / 3540269096
Quantity Available
1
Seller
Woodside, New York, United States
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
NZ$113.40
NZ$6.59 shipping to USA

Show Details

Description:
Springer , pp. 424 . Hardback. Used.
Item Price
NZ$113.40
NZ$6.59 shipping to USA
Applied Scanning Probe Methods III: Characterization (NanoScience and Technology)
Stock Photo: Cover May Be Different

Applied Scanning Probe Methods III: Characterization (NanoScience and Technology)

by Bhushan, Bharat [Editor]; Fuchs, Harald [Editor];

  • Used
  • Hardcover
Condition
New
Binding
Hardcover
ISBN 10 / ISBN 13
9783540269090 / 3540269096
Quantity Available
1
Seller
Branchville, New Jersey, United States
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
NZ$113.81
NZ$6.60 shipping to USA

Show Details

Description:
Springer, 2006-02-22. hardcover. Like New. 6x0x9. Book is in excellent condition, text is unmarked and pages are tight.
Item Price
NZ$113.81
NZ$6.60 shipping to USA
Applied Scanning Probe Methods Iii: Characterization (Nanoscience And Technology)
Stock Photo: Cover May Be Different

Applied Scanning Probe Methods Iii: Characterization (Nanoscience And Technology)

  • New
Condition
New
ISBN 10 / ISBN 13
9783540269090 / 3540269096
Quantity Available
1
Seller
New Delhi, India
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
NZ$195.05
NZ$8.25 shipping to USA

Show Details

Description:
New/New. Brand New Original US Edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed!
Item Price
NZ$195.05
NZ$8.25 shipping to USA
Applied Scanning Probe Methods III: Characterization
Stock Photo: Cover May Be Different

Applied Scanning Probe Methods III: Characterization

by Bharat Bhushan

  • New
  • Hardcover
Condition
New
Binding
Hardcover
ISBN 10 / ISBN 13
9783540269090 / 3540269096
Quantity Available
149
Seller
Uxbridge, Greater London, United Kingdom
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
NZ$280.59
NZ$16.74 shipping to USA

Show Details

Description:
Hard Cover. New. New Book; Fast Shipping from UK; Not signed; Not First Edition; The Applied Scanning Probe Methods III: Characterization.
Item Price
NZ$280.59
NZ$16.74 shipping to USA
Applied Scanning Probe Methods III: Characterization
Stock Photo: Cover May Be Different

Applied Scanning Probe Methods III: Characterization

by Bhushan, Bharat (Editor)/ Fuchs, Harald (Editor)

  • New
  • Hardcover
Condition
New
Binding
Hardcover
ISBN 10 / ISBN 13
9783540269090 / 3540269096
Quantity Available
2
Seller
Exeter, Devon, United Kingdom
Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
Item Price
NZ$362.14
NZ$20.95 shipping to USA

Show Details

Description:
Springer Verlag, 2006. Hardcover. New. 1st edition. 378 pages. 9.50x6.75x0.75 inches.
Item Price
NZ$362.14
NZ$20.95 shipping to USA
Applied Scanning Probe Methods Iii: Characterization (nanoscience And Technology)
Stock Photo: Cover May Be Different

Applied Scanning Probe Methods Iii: Characterization (nanoscience And Technology)

by Bharat Bhushan,

  • New
  • first
Condition
New
Edition
1st
ISBN 10 / ISBN 13
9783540269090 / 3540269096
Quantity Available
10
Seller
New Delhi, Delhi, India
Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
Item Price
NZ$672.65
NZ$24.74 shipping to USA

Show Details

Description:
Springer, 2006. 1st. New.
Item Price
NZ$672.65
NZ$24.74 shipping to USA
Applied Scanning Probe Methods Iii: Characterization (nanoscience And Technology)
Stock Photo: Cover May Be Different

Applied Scanning Probe Methods Iii: Characterization (nanoscience And Technology)

by Bharat Bhushan,

  • New
  • first
Condition
New
Edition
1st
ISBN 10 / ISBN 13
9783540269090 / 3540269096
Quantity Available
10
Seller
New Delhi, Delhi, India
Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
Item Price
NZ$672.65
NZ$24.74 shipping to USA

Show Details

Description:
Springer, 2006. 1st. New.
Item Price
NZ$672.65
NZ$24.74 shipping to USA