Stock Photo: Cover May Be Different
Applied Scanning Probe Methods Iii: Characterization (nanoscience And Technology) Hardcover - 2006
by Bharat Bhushan,
- New
- first
Description
New
NZ$674.77
NZ$24.82
Shipping to USA
Standard delivery: 20 to 30 days
More Shipping Options
Standard delivery: 20 to 30 days
Ships from BookVistas (Delhi, India)
About BookVistas Delhi, India
Specializing in: Art, Archaeology & Architecture, Computers, History, Culture & Politics, Languages, Literature & Linguistics, Management, Music, Dance & Theatre, Religion & Philosophy, Science, Technology & Medicine
Biblio member since 2011
30 day return guarantee, with full refund including shipping costs for up to 30 days after delivery if an item arrives misdescribed or damaged.
All books are new.
Additional shipping charges may be required for multi-volume sets.
Details
- Title Applied Scanning Probe Methods Iii: Characterization (nanoscience And Technology)
- Author Bharat Bhushan,
- Binding Hardcover
- Edition 1st
- Condition New
- Pages 378
- Volumes 1
- Language ENG
- Publisher Springer
- Date 2006
- Illustrated Yes
- Features Illustrated, Index, Table of Contents
- Bookseller's Inventory # DBS-9783540269090
- ISBN 9783540269090 / 3540269096
- Weight 1.58 lbs (0.72 kg)
- Dimensions 9.42 x 6.48 x 0.79 in (23.93 x 16.46 x 2.01 cm)
- Dewey Decimal Code 502.82