Applied Scanning Probe Methods IIi

by Bhushan, Bharat

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APPLIED SCANNING PROBE METHODS III: CHARACTERIZATION (NANOSCIENCE AND TECHNOLOGY)

by BHARAT BHUSHAN,

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1St
Published
2006
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Hardcover
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9783540269090
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Springer, 2006. 1St. Hardcover. New/New.
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Applied Scanning Probe Methods III: Characterization (NanoScience and Technology)

by Bhushan, Bharat [Editor]; Fuchs, Harald [Editor];

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2006-02-22
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Hardcover
ISBN
9783540269090
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Springer, 2006-02-22. hardcover. Like New. 6x0x9. Book is in excellent condition, text is unmarked and pages are tight.
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Applied Scanning Probe Methods Iii: Characterization (nanoscience And Technology)

by Bharat Bhushan,

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1st
Published
2006
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9783540269090
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New Delhi, IND
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Springer, 2006. 1st. New.
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Applied Scanning Probe Methods Iii: Characterization (nanoscience And Technology)

by Bharat Bhushan,

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1st
Published
2006
ISBN
9783540269090
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Springer, 2006. 1st. New.
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Applied Scanning Probe Methods III: Characterization

by Bhushan, Bharat (Editor)/ Fuchs, Harald (Editor)

Condition
New
Published
2006
Binding
Hardcover
ISBN
9783540269090
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Exeter, Devon, GBR
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Springer Verlag, 2006. Hardcover. New. 1st edition. 378 pages. 9.50x6.75x0.75 inches.
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NZ$366.08
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Applied Scanning Probe Methods III: Characterization (NanoScience and Technology)

by Bhushan, Bharat [Editor]; Fuchs, Harald [Editor];

Condition
New
Binding
Hardcover
ISBN
9783540269090
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1
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campbelltown, Florida, USA
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Springer. hardcover. New. 6x0x9. Brand New Book in Publishers original Sealing
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