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Cracking The Machine Learning Interview

Cracking The Machine Learning Interview

Cracking The Machine Learning Interview
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Cracking The Machine Learning Interview Paperback -

by Suri, Nitin

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Independently Published. Used - Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Details

  • Title Cracking The Machine Learning Interview
  • Author Suri, Nitin
  • Binding Paperback
  • Condition Used - Good
  • Pages 114
  • Volumes 1
  • Language ENG
  • Publisher Independently Published
  • Bookseller's Inventory # 56595534-75
  • ISBN 9781729223604 / 1729223605
  • Weight 0.36 lbs (0.16 kg)
  • Dimensions 9 x 6 x 0.24 in (22.86 x 15.24 x 0.61 cm)
  • Category Computers - General Information
  • Quantity available 1

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From the publisher

"A breakthrough in machine learning would be worth ten Microsofts." -Bill Gates

Despite being one of the hottest disciplines in the Tech industry right now, Artificial Intelligence and Machine Learning remain a little elusive to most.The erratic availability of resources online makes it extremely challenging for us to delve deeper into these fields. Especially when gearing up for job interviews, most of us are at a loss due to the unavailability of a complete and uncondensed source of learning.

Cracking the Machine Learning Interview


  • Equips you with 225 of the best Machine Learning problems along with their solutions.

  • Requires only a basic knowledge of fundamental mathematical and statistical concepts.

  • Assists in learning the intricacies underlying Machine Learning concepts and algorithms suited to specific problems.

  • Uniquely provides a manifold understanding of both statistical foundations and applied programming models for solving problems.

  • Discusses key points and concrete tips for approaching real life system design problems and imparts the ability to apply them to your day to day work.

This book covers all the major topics within Machine Learning which are frequently asked in the Interviews. These include:


  • Supervised and Unsupervised Learning

  • Classification and Regression

  • Decision Trees

  • Ensembles

  • K-Nearest Neighbors

  • Logistic Regression

  • Support Vector Machines

  • Neural Networks

  • Regularization

  • Clustering

  • Dimensionality Reduction

  • Feature Extraction

  • Feature Engineering

  • Model Evaluation

  • Natural Language Processing

  • Real life system design problems

  • Mathematics and Statistics behind the Machine Learning Algorithms

  • Various distributions and statistical tests

This book can be used by students and professionals alike. It has been drafted in a way to benefit both, novices as well as individuals with substantial experience in Machine Learning.

Following Cracking The Machine Learning Interview diligently would equip you to face any Machine Learning Interview.

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