An Introduction to Error Analysis: The Study of Uncertainties in Physical Measurements Paperback - 1996
by John R. Taylor
- New
- Paperback
NZ$59.72
NZ$8.95
Delivery within USA
Standard delivery: 7 to 14 days
More delivery options
Standard delivery: 7 to 14 days
Ships from Schwabe Books (California, United States)
Details
- Title An Introduction to Error Analysis: The Study of Uncertainties in Physical Measurements
- Author John R. Taylor
- Binding Paperback
- Edition [ Edition: secon
- Condition New
- Pages 327
- Volumes 1
- Language ENG
- Publisher University Science Books, U.S.A.
- Publication date 1996-08-01
- Bookseller's Inventory # mon0004064440
- ISBN 9780935702750 / 093570275X
- Weight 1.4 lbs (0.64 kg)
- Dimensions 10 x 7 x 0.73 in (25.40 x 17.78 x 1.85 cm)
- Size 0.7300 8.4300 5.8500
- Category Mathematics
- Library of Congress subjects Mathematical physics, Physical measurements
- Library of Congress Catalogue Number 96000953
- Dewey Decimal Code 530.16
- Quantity available 21
- Bookseller catalogues Book
About Schwabe Books California, United States
Biblio member since 2010
We offer over 150,000 books in all subject areas. Heavy concentration in the following subject areas: Academic/university press, Antiquarian/Rare and general non-fiction.
Reader reviews for An Introduction to Error Analysis: The Study of Uncertainties in Physical Measurements
Write a review for this book
Important Terms and Guidelines
- Please focus on the book’s content and context. Also, add any personal comments as to how you enjoyed the book. Substantiate your likes and dislikes. You may make comparisons to other books.
- Reviews must be at least 140 characters in length.
- Please do not reveal critical plot elements.
- This is not a help line. Contact customer support if you need help.
Your review must not include:
- Obscenities, discriminatory language, or other insulting language not suitable for public domain
- Advertisements, “spam” content, or references to other products, offers or websites.
- Email addresses, URLs, phone numbers, physical addresses or other contact information.
- Overly critical comments about other reviews or reviewers
- Time-sensitive material (i.e. promotional tours, seminars, lectures, etc.)
- Availability, price, or alternative ordering/shipping information
From the publisher
First line
HASH(0x110b0330)